Publication:
RF performance vulnerability to hot carrier stress and consequent breakdown in low power 90nm RFCMOS
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1955 since deposited on 2021-10-15
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Acq. date: 2026-04-07
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Statistics
Views
1955 since deposited on 2021-10-15
1last month
1last week
Acq. date: 2026-04-07
Citations