Publication:
RF performance vulnerability to hot carrier stress and consequent breakdown in low power 90nm RFCMOS
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1954 since deposited on 2021-10-15
1last month
Acq. date: 2025-12-11
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Metrics
Views
1954 since deposited on 2021-10-15
1last month
Acq. date: 2025-12-11
Citations