Browsing by Author "Chiaradia, David"
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Publication EM-induced mass transport at the Cu/barrier interface: a new test structure for rapid assessment at user conditions
Proceedings paper2003, Proceedings of the IEEE International Interconnect Technology Conference - IITC, 2/06/2003, p.21-23Publication The influence of a structurally induced current crowding on electromigration
Journal article2004, Microelectronic Engineering, (76) 1_4, p.241-244