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Conference contributions
EM-induced mass transport at the Cu/barrier interface: a new test structure for rapid assessment at user conditions
Publication:
EM-induced mass transport at the Cu/barrier interface: a new test structure for rapid assessment at user conditions
Date
2003
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bruynseraede, Christophe
;
Chiaradia, David
;
Wang, Hui
;
Maex, Karen
Journal
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1934
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
Metrics
Views
1934
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations