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Browsing by Author "Chino, M."

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    Inelastic X-ray Scattering Measurement on Single-Crystalline GeSn Thin Film

    Chino, M.
    ;
    Yokogawa, R.
    ;
    Ogura, A.
    ;
    Uchiyama, H.
    ;
    Tatsuoka, H.
    ;
    Shimura, Yosuke  
    Journal article
    2023, JOURNAL OF ELECTRONIC MATERIALS, (52) 8, p.5218-5133

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