Publication:

Inelastic X-ray Scattering Measurement on Single-Crystalline GeSn Thin Film

Date

2023
Journal article
https://doi.org/10.1007/s11664-023-10421-x
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Author(s)

Chino, M.
;
Yokogawa, R.
;
Ogura, A.
;
Uchiyama, H.
;
Tatsuoka, H.
;
Shimura, Yosuke  

Journal

JOURNAL OF ELECTRONIC MATERIALS

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1048 since deposited on 2023-05-22
3last month
Acq. date: 2026-10-12

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1048 since deposited on 2023-05-22
3last month
Acq. date: 2026-10-12

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