Browsing by Author "Chong, Yiliang"
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Publication Hole Generation Triggered Dynamic Drain Induced Barrier Lowering of RF GaN MIS-HEMTs
Journal article2026, IEEE ELECTRON DEVICE LETTERS, (47) 9, p.1740-1743Publication Understanding Gate Breakdown Mechanisms in RF GaN MIS-HEMTs with thin gate SiN
Proceedings paper2026, IEEE International Reliability Physics Symposium (IRPS), 2026-03-22, p.1-6