Browsing by Author "Chu, L.K."
Now showing 1 - 1 of 1
- Results Per Page
- Sort Options
Publication Low interfacial trap density and sub-nm equivalent oxide thickness in In0.53Ga0.47As (001) metal-oxide-semiconductor devices using molecular beam deposited HfO2/Al2O3 as gate dielectrics
Journal article2011, Applied Physics Letters, (99) 4, p.42908