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Browsing by Author "Chung, T.M."

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    Investigation of charge control related performances in double-gate SOI MOSFETs

    Kilchytska, V.
    ;
    Chung, T.M.
    ;
    van Meer, Hans
    ;
    De Meyer, Kristin  
    ;
    Raskin, J.P.
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    Flandre, D.
    Proceedings paper
    2003, Silicon-on-Insulator Technology and Devices XI, 28/04/2003, p.225-230
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    On the origin of the excess low-frequency noise in graded-channel silicon-on-insulator nMOSFETs

    Simoen, Eddy  
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    Claeys, Cor
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    Chung, T.M.
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    Flandre, D.
    ;
    Raskin, J.P.
    Journal article
    2007, IEEE Electron Device Letters, (28) 10, p.919-921
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    The length-dependence of the 1/f noise of graded-channel SOI nMOSFETs

    Simoen, Eddy  
    ;
    Claeys, Cor
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    Chung, T.M.
    ;
    Flandre, D.
    ;
    Raskin, J.P.
    Proceedings paper
    2007, Microelectonics Technology and Devices SBMICRO 2007, 3/09/2007, p.373-381
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    The low-frequency noise behaviour of graded-channel SOI nMOSFETs

    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Chung, T.M.
    ;
    Flandre, D.
    ;
    Pavanello, M.A.
    ;
    Martino, J.A.
    ;
    Raskin, J.P.
    Journal article
    2007, Solid-State Electronics, (51) 2, p.260-267

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