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On the origin of the excess low-frequency noise in graded-channel silicon-on-insulator nMOSFETs
Publication:
On the origin of the excess low-frequency noise in graded-channel silicon-on-insulator nMOSFETs
Date
2007
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Claeys, Cor
;
Chung, T.M.
;
Flandre, D.
;
Raskin, J.P.
Journal
IEEE Electron Device Letters
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1944
since deposited on 2021-10-16
Acq. date: 2025-10-24
Citations
Metrics
Views
1944
since deposited on 2021-10-16
Acq. date: 2025-10-24
Citations