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Browsing by Author "Claes, M."

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    Controlled deposition of organic contamination and removal with ozone-based cleaning

    Claes, M.
    ;
    De Gendt, Stefan  
    ;
    Kenens, Conny
    ;
    Conard, Thierry  
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    Bender, Hugo  
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    Storm, Wolfgang
    Journal article
    2001, Journal of the Electrochemical Society, (148) 3, p.G118-125
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    Determination of degradation products in O3/DI processes

    Vankerckhoven, Hans
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    De Smedt, Frank
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    Van Herp, Bart
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    Claes, M.
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    De Gendt, Stefan  
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    Heyns, Marc  
    Oral presentation
    2001, 15th World Congress of the International Ozone Association; 10-15 September 2001; London, UK.
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    Developments in cleaning technology for critical layers

    Heyns, Marc  
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    Arnauts, Sophia  
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    Bearda, Twan
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    Claes, M.
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    Cornelissen, Ingrid  
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    De Gendt, Stefan  
    Oral presentation
    2000, Santa Clara Plastics Symposium on Cleaning Technology; May 2000
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    Making the cleaner greener

    Bergman, E.
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    Lagrange, Sébastien
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    Claes, M.
    Journal article
    2001, European Semiconductor, March, p.81-84
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    Ozonated HF applications in a spray processing tool

    Claes, M.
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    Röhr, Erika
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    De Gendt, Stefan  
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    Heyns, Marc  
    ;
    Lagrange, Sébastien
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    Bergman, E.
    Meeting abstract
    2001, 200th Meeting of the Electrochemical Society: 7th International Symposium on Cleaning Technology in Semiconductor Device Manufac, 2/09/2001
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    Quantification problems in light element determination by grazing emission X-ray fluorescence

    Kuczumow, A.
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    Claes, M.
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    Schmeling, M.
    ;
    Van Grieken, R.
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    De Gendt, Stefan  
    Journal article
    2000, Journal of Analytical Atomic Spectrometry, (15) 4, p.415-421
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    Removal of photoresist by O3DI water processes: determination of degradation products

    Vankerckhoven, Hans
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    De Smedt, Frank
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    Vinckier, Chris
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    Van Herp, Bart
    ;
    Claes, M.
    ;
    De Gendt, Stefan  
    Meeting abstract
    2001, 200th Meeting of the Electrochemical Society: 7th International Symposium on Cleaning Technology in Semiconductor Device Manufac, 2/09/2001
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    The increasing importance of the use of ozone in micro-electronics industry

    De Smedt, Frank
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    De Gendt, Stefan  
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    Claes, M.
    ;
    Heyns, Marc  
    ;
    Vankerckhoven, Hans
    ;
    Vinckier, Chris
    Oral presentation
    2001, 15th World Congress of the International Ozone Association; 10-15 September 2001; London, UK.
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    The removal of organic contamination by O3/DI water processes: a theoretical study

    De Smedt, Frank
    ;
    Vankerckhoven, Hans
    ;
    Vinckier, Chris
    ;
    De Gendt, Stefan  
    ;
    Claes, M.
    ;
    Heyns, Marc  
    Meeting abstract
    2001, 200th Meeting of the Electrochemical Society: 7th International Symposium on Cleaning Technology in Semiconductor Device Manufac, 2/09/2001
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    Use of grazing emission XRF for silicon wafer surface contamination measurements

    De Gendt, Stefan  
    ;
    Kenis, Karine  
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    Mertens, Paul  
    ;
    Heyns, Marc  
    ;
    Claes, M.
    ;
    Van Grieken, R. E.
    Proceedings paper
    1996, Proceedings of the 3rd International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS, 23/09/1996, p.57-60

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