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Browsing by Author "Clauws, Paul"

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    Deep-level transient spectroscopic study of quenched-in defects in germanium

    Segers, Siegfried
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    Lauwaert, Johan
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    Clauws, Paul
    ;
    Callens, Freddy
    ;
    Vanhellemont, Jan
    Oral presentation
    2014, EMRS Spring Meeting Symposium X: Materials Research for Group IV Semiconductors
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    Direct estimation of captive cross sections in the presence of low capture: application of the identifcation of quenched-in deep-level defects in Ge

    Segers, Siegfried
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    Lauwaert, Johan
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    Clauws, Paul
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    Simoen, Eddy  
    ;
    Vanhellemont, Jan
    Journal article
    2014, Semiconductor Science and Technology, (29) 12, p.125007
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    Electronic properties of manganese in germanium

    Lauwaert, Johan
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    Segers, Siegfried
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    Moens, Filip
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    Opsomer, Karl  
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    Clauws, Paul
    ;
    Callens, Freddy
    Journal article
    2015, Journal of Physics D: Applied Physics, (48) 17, p.175101
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    Mn related defect levels in germanium

    Lauwaert, Johan
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    Moens, Filip
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    Segers, Siegfried
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    Opsomer, Karl  
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    Simoen, Eddy  
    ;
    Vanhellemont, Jan
    Proceedings paper
    2014, 226th ECS Fall Meeting - High Purity and High Mobility Semiconductors Symposium, 5/10/2014, p.1658
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    Study of metal-related deep-level defects in germanide Schottky barriers on n-type germanium

    Simoen, Eddy  
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    Opsomer, Karl  
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    Claeys, Cor
    ;
    Maex, Karen  
    ;
    Detavernier, Christophe
    Journal article
    2008, Journal of Applied Physics, (104) 2, p.23705
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    Temperature-independent slow carrier emission from deep-level defects in p-type germanium

    Segers, Siegfried
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    Lauwaert, Johan
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    Clauws, Paul
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    Simoen, Eddy  
    ;
    Vanhellemont, Jan
    Journal article
    2013, Journal of Physics D: Applied Physics, (46) 42, p.425101
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    Tunnel emission for Co and Cr related levels in p-type Ge

    Segers, Siegfried
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    Lauwaert, Johan
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    Clauws, Paul
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    Simoen, Eddy  
    ;
    Vanhellemont, Jan
    Meeting abstract
    2013, International Conference on Defects in Semiconductors, 15/07/2013, p.1
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    What do we know about hydrogen-induced thermal donors?

    Simoen, Eddy  
    ;
    Huang, YueLong
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    Ma, Yue
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    Lauwaert, Johan
    ;
    Clauws, Paul
    ;
    Rafi, Joan Marc
    Proceedings paper
    2008, High Purity Silicon 10, 13/10/2008, p.129-150

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