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Browsing by Author "Cobb, J."

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    Publication

    Back Barrier Trapping Induced Resistance Dispersion in GaN HEMT: Mechanism, Modeling, and Solutions

    Yu, Hao  
    ;
    Parvais, Bertrand  
    ;
    Peralagu, Uthayasankaran  
    ;
    ElKashlan, Rana Y.  
    ;
    Rodriguez, Raul  
    Proceedings paper
    2022-12-01, International Electron Devices Meeting (IEDM), DEC 03-07, 2022

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