Publication:

Back Barrier Trapping Induced Resistance Dispersion in GaN HEMT: Mechanism, Modeling, and Solutions

Date

2022
Proceedings Paper
https://doi.org/10.1109/iedm45625.2022.10019489
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

Accepted version 801.8 KB

Author(s)

Yu, Hao  
;
Parvais, Bertrand  
;
Peralagu, Uthayasankaran  
;
ElKashlan, Rana Y.  
;
Rodriguez, Raul  
;
Khaled, Ahmad  
;
Yadav, Sachin  
;
Alian, AliReza  
;
Zhao, Ming  
;
Braga, N. de Almeida
;
Cobb, J.
;
Fang, J.
;
Cardinael, Pieter  
;
Sibaja-Hernandez, Arturo  
;
Collaert, Nadine  

Journal

na

Abstract

Description

Statistics

Downloads

977 since deposited on 2023-05-25
77last month
14last week
Acq. date: 2026-08-06

Views

1292 since deposited on 2023-05-25
1last month
Acq. date: 2026-08-06

Citations

Statistics

Downloads

977 since deposited on 2023-05-25
77last month
14last week
Acq. date: 2026-08-06

Views

1292 since deposited on 2023-05-25
1last month
Acq. date: 2026-08-06

Citations