Publication:

Back Barrier Trapping Induced Resistance Dispersion in GaN HEMT: Mechanism, Modeling, and Solutions

Date

2022-12-01
Proceedings Paper
https://doi.org/10.1109/IEDM45625.2022.10019489
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dc.contributor.authorYu, Hao
dc.contributor.authorParvais, Bertrand
dc.contributor.authorPeralagu, Uthayasankaran
dc.contributor.authorElKashlan, Rana Y.
dc.contributor.authorRodriguez, Raul
dc.contributor.authorKhaled, Ahmad
dc.contributor.authorYadav, Sachin
dc.contributor.authorAlian, AliReza
dc.contributor.authorZhao, Ming
dc.contributor.authorBraga, N. de Almeida
dc.contributor.authorCobb, J.
dc.contributor.authorFang, J.
dc.contributor.authorCardinael, Pieter
dc.contributor.authorSibaja-Hernandez, Arturo
dc.contributor.authorCollaert, Nadine
dc.contributor.imecauthorYu, Hao
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorPeralagu, Uthayasankaran
dc.contributor.imecauthorElKashlan, Rana Y.
dc.contributor.imecauthorRodriguez, Raul
dc.contributor.imecauthorKhaled, Ahmad
dc.contributor.imecauthorYadav, Sachin
dc.contributor.imecauthorAlian, AliReza
dc.contributor.imecauthorZhao, Ming
dc.contributor.imecauthorCardinael, Pieter
dc.contributor.imecauthorSibaja-Hernandez, Arturo
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecYu, Hao::0000-0002-1976-0259
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecPeralagu, Uthayasankaran::0000-0001-9166-4408
dc.contributor.orcidimecElKashlan, Rana Y.::0000-0003-0576-4344
dc.contributor.orcidimecRodriguez, Raul::0000-0002-4457-8942
dc.contributor.orcidimecKhaled, Ahmad::0000-0003-2892-3176
dc.contributor.orcidimecYadav, Sachin::0000-0003-4530-2603
dc.contributor.orcidimecAlian, AliReza::0000-0003-3463-416X
dc.contributor.orcidimecZhao, Ming::0000-0002-0856-851X
dc.contributor.orcidimecCardinael, Pieter::0000-0002-8603-2497
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2023-06-16T07:16:40Z
dc.date.available2023-05-25T20:20:22Z
dc.date.available2023-05-31T07:53:59Z
dc.date.available2023-06-16T07:16:40Z
dc.date.embargo2022-12-31
dc.date.issued2022-12-01
dc.identifier.doi10.1109/IEDM45625.2022.10019489
dc.identifier.eisbn978-1-6654-8959-1
dc.identifier.issn2380-9248
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41628
dc.publisherIEEE
dc.source.conferenceInternational Electron Devices Meeting (IEDM)
dc.source.conferencedateDEC 03-07, 2022
dc.source.conferencelocationSan Francisco
dc.source.journalna
dc.source.numberofpages4
dc.title

Back Barrier Trapping Induced Resistance Dispersion in GaN HEMT: Mechanism, Modeling, and Solutions

dc.typeProceedings paper
dspace.entity.typePublication
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