Browsing by Author "Cosemans, P."

Dynamics of electromigration induced void-hillock growth and precipitation/dissolution of addition elements studied by in-situ electron microscopy resistance measurements

Electromigration-induced drift in damascene and plasma-etched Al(Cu). I: Kinetics of Cu depletion in polycrystalline interconnects

Stress relaxation in Al(Cu) thin films

Stress relaxation in Al-Cu and Al-Si-Cu thin films

Study of Cu diffusion in an Al-1%Si-0.5%Cu bond pad with an Al-1%Si bond wire attached using scanning electron microscopy

Thin nanocrystalline CVD diamond films based on nanodiamond / TiO2 sol-gel composites