Browsing by Author "Costantini, Felipe"
Now showing 1 - 1 of 1
- Results per page
- Sort Options
Publication Probing defects generation during stress in high- $j/metal gate FinFETs by random telegraph noise characterization
Proceedings paper2016, 46th European Solid-State Device Research Conference - ESSDERC, 12/09/2016, p.252-255