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Browsing by Author "Costantini, Felipe"

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    Probing defects generation during stress in high- $j/metal gate FinFETs by random telegraph noise characterization

    Puglisi, Francesco Maria
    ;
    Costantini, Felipe
    ;
    Kaczer, Ben  
    ;
    Larcher, Luca
    ;
    Pavan, Paolo
    Proceedings paper
    2016, 46th European Solid-State Device Research Conference - ESSDERC, 12/09/2016, p.252-255

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