Publication:
Probing defects generation during stress in high- $j/metal gate FinFETs by random telegraph noise characterization
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1948 since deposited on 2021-10-23
1last month
Acq. date: 2026-04-25
Citations
Statistics
Views
1948 since deposited on 2021-10-23
1last month
Acq. date: 2026-04-25
Citations