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Browsing by Author "Cowern, Nick"

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    Gettering of transition metals by porous silicon in epitaxial silicon solar cells

    Sivaramakrishnan Radhakrishnan, Hariharsudan  
    ;
    Ahn, Chihak
    ;
    Van Hoeymissen, Jan
    Journal article
    2012, Physica Status Solidi A, (209) 10, p.1866-1871
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    Impact of multiple sub-melt laser scans on the activation and diffusion of shallow Boron junctions

    Rosseel, Erik  
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    Vandervorst, Wilfried  
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    Clarysse, Trudo
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    Goossens, Jozefien
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    Moussa, Alain  
    Proceedings paper
    2008, 16th IEEE International Conference on Advanced Thermal Processing of Semiconductors - RTP, 30/09/2008, p.135-140
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    Review of electrical characterization of ultra-shallow junctions with micro four-point probes

    Petersen, Dirch
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    Hansen, Ole
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    Hansen, Torben
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    Boggild, Peter
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    Lin, Rong
    ;
    Kjaer, Daniel
    Journal article
    2010, Journal of Vacuum Science and Technology B, (28) 1, p.C1C27-C1C33
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    Role of C and B clusters in transient diffusion of B in silicon

    Cowern, Nick
    ;
    Cacciato, A.
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    Custer, J. S.
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    Saris, F. W.
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    Vandervorst, Wilfried  
    Journal article
    1996, Applied Physics Letters, (68) 8, p.1150-1152
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    Shallow junctions for sub-100 nm CMOS technology

    Meyssen, Veerle
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    Stolk, Peter
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    van Zijl, Jeroen
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    van Berkum, Jurgen
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    van de Wijgert, Willem
    Proceedings paper
    2001, Si Front-End Processing - Physics and Technology of Dopant-Defect Interactions III, 17/04/2001, p.J.3.5.1-J3.5.6
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    Ultrashallow junctions for advanced CMOS technology

    Stolk, Peter
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    Meyssen, Veerle
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    Lindsay, Richard
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    Dachs, Charles
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    Mannino, Giovanni
    ;
    Cowern, Nick
    Proceedings paper
    2001, Proceedings SEMI Front End Technology Conference, 24/04/2001

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