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Review of electrical characterization of ultra-shallow junctions with micro four-point probes
Publication:
Review of electrical characterization of ultra-shallow junctions with micro four-point probes
Date
2010
Journal article
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19475.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Petersen, Dirch
;
Hansen, Ole
;
Hansen, Torben
;
Boggild, Peter
;
Lin, Rong
;
Kjaer, Daniel
;
Nielsen, Peter F.
;
Clarysse, Trudo
;
Vandervorst, Wilfried
;
Rosseel, Erik
;
Bennett, Nick
;
Cowern, Nick
Journal
Journal of Vacuum Science and Technology B
Abstract
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1
since deposited on 2021-10-18
Acq. date: 2025-10-24
Views
1954
since deposited on 2021-10-18
Acq. date: 2025-10-24
Citations
Metrics
Downloads
1
since deposited on 2021-10-18
Acq. date: 2025-10-24
Views
1954
since deposited on 2021-10-18
Acq. date: 2025-10-24
Citations