Browsing by Author "Cros, A."

Now showing 1 - 3 of 3

An extended "Y function" method for saturation regime characterization: application to bulk Si and Ge technologies

Diouf, C.
;
Cros, A.
;
Monfray, S.
;
Mitard, Jerome
;
Rosa, J.
;
Gloria, D.
;
Ghibaudo, G.
Proceedings paper
2012, International Conference on Solid State Devices and Materials - SSDM, 25/09/2012
Electrical transport characterization of nano CMOS devices with ultra-thin silicon film

Ghibaudo, G.
;
Mouis, M.
;
Pham-Nguyen, L.
;
Bennamane, K.
;
Pappas, I.
;
Cros, A.
;
Bidal, G.
;
Fleury, D.
Proceedings paper
2009, 9th International Workshop on Junction Technology - IWJT, 11/06/2009, p.58-63
Y function method applied to saturation regime: apaprent saturation mobility and saturation velocity extraction

Diouf, C.
;
Cros, A.
;
Monfray, S.
;
Mitard, Jerome
;
Rosa, S.
;
Gloria, D.
;
Ghibaudo, G.
Journal article
2013, Solid-State Electronics, 85, p.12-14