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An extended "Y function" method for saturation regime characterization: application to bulk Si and Ge technologies
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An extended "Y function" method for saturation regime characterization: application to bulk Si and Ge technologies
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Date
2012
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Diouf, C.
;
Cros, A.
;
Monfray, S.
;
Mitard, Jerome
;
Rosa, J.
;
Gloria, D.
;
Ghibaudo, G.
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1854
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Acq. date: 2025-12-11
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Metrics
Views
1854
since deposited on 2021-10-20
1
last month
Acq. date: 2025-12-11
Citations