Publication:

An extended "Y function" method for saturation regime characterization: application to bulk Si and Ge technologies

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1852 since deposited on 2021-10-20
Acq. date: 2025-10-23

Citations

Metrics

Views

1852 since deposited on 2021-10-20
Acq. date: 2025-10-23

Citations