Publication:
An extended "Y function" method for saturation regime characterization: application to bulk Si and Ge technologies
Date
| dc.contributor.author | Diouf, C. | |
| dc.contributor.author | Cros, A. | |
| dc.contributor.author | Monfray, S. | |
| dc.contributor.author | Mitard, Jerome | |
| dc.contributor.author | Rosa, J. | |
| dc.contributor.author | Gloria, D. | |
| dc.contributor.author | Ghibaudo, G. | |
| dc.contributor.imecauthor | Mitard, Jerome | |
| dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
| dc.date.accessioned | 2021-10-20T10:45:26Z | |
| dc.date.available | 2021-10-20T10:45:26Z | |
| dc.date.issued | 2012 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/20614 | |
| dc.source.conference | International Conference on Solid State Devices and Materials - SSDM | |
| dc.source.conferencedate | 25/09/2012 | |
| dc.source.conferencelocation | Kyoto Japan | |
| dc.title | An extended "Y function" method for saturation regime characterization: application to bulk Si and Ge technologies | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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