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Browsing by Author "Daenen, T."

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    Impact of elevated source drain architecture on ESD protection devices for a 90 nm CMOS technology node

    Thijs, Steven  
    ;
    De Heyn, Vincent  
    ;
    Vassilev, Vesselin
    ;
    Mahadeva Iyer, Natarajan
    ;
    Linten, Dimitri  
    Proceedings paper
    2003-09, EOS/ESD Symposium, 21/09/2003, p.242-249

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