Browsing by Author "De Brabanter, K."
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Publication Detailed analysis of charge pumping and IdVg hysteresis for profiling traps in SiO2/HfSiO(N)
; ; ; Zahid, MohammedJournal article2010-12, Microelectronic Engineering, (87) 12, p.2614-2619Publication HfSiO bulk trap density controls the initial Vth in nMOSFETs
; ; ; Gilbert, MatthieuJournal article2012-06, IEEE Transactions on Device and Materials Reliability, (12) 2, p.323-334Publication Nonparametric comparison of densities based on statistical bootstrap
Proceedings paper2010, 4th European Conference on the Use of Modern Information and Communication Technologies - ECUMICT, 25/03/2010