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Detailed analysis of charge pumping and IdVg hysteresis for profiling traps in SiO2/HfSiO(N)
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Detailed analysis of charge pumping and IdVg hysteresis for profiling traps in SiO2/HfSiO(N)
Date
2010-12
Journal article
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21328.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sahhaf, Sahar
;
Degraeve, Robin
;
Cho, Moon Ju
;
De Brabanter, K.
;
Roussel, Philippe
;
Zahid, Mohammed
;
Groeseneken, Guido
Journal
Microelectronic Engineering
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1902
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations
Metrics
Views
1902
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations