Publication:
Detailed analysis of charge pumping and IdVg hysteresis for profiling traps in SiO2/HfSiO(N)
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1905 since deposited on 2021-10-18
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Acq. date: 2026-02-25
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1905 since deposited on 2021-10-18
1last month
1last week
Acq. date: 2026-02-25
Citations