Request a copy of the file
Enter the following information to request a copy for the following item: Detailed analysis of charge pumping and IdVg hysteresis for profiling traps in SiO2/HfSiO(N)
Requesting the following file: 21328.pdf
Enter the following information to request a copy for the following item: Detailed analysis of charge pumping and IdVg hysteresis for profiling traps in SiO2/HfSiO(N)
Requesting the following file: 21328.pdf