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Browsing by Author "De Gryse, R."

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    Nondestructive characterization of thin silicides using x-ray reflectivity

    Detavernier, C.
    ;
    De Gryse, R.
    ;
    Van Meirhaeghe, R. L.
    ;
    Cardon, F.
    ;
    Ru, Guo-Ping
    ;
    Qu, Xin-Ping
    Journal article
    2000, J. Vacuum Science and Technology A, (A18) 2, p.470-476

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