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Browsing by Author "De Keukeleire, Catherine"

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    Hot hole degradation effects in lateral nDMOS transistors

    Moens, Peter  
    ;
    Van den Bosch, Geert  
    ;
    De Keukeleire, Catherine
    ;
    Degraeve, Robin  
    ;
    Tack, Marnix
    Journal article
    2004-10, IEEE Trans. Electron Devices, (2004) 51, p.1704-1710

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