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Browsing by Author "Debie, Peter"

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    Accurate Error Correction Technique for On-Chip Lightwave Measurements of Optoelectronic Devices

    Debie, Peter
    ;
    Martens, Luc  
    Proceedings paper
    1994, 1994 IEEE MTT-S Microwave Symposium, 23/05/1994, p.1589-1592
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    Accurate on-wafer measurement of phase and amplitude of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave device

    Verspecht, J.
    ;
    Debie, Peter
    ;
    Barel, A.
    ;
    Martens, Luc  
    Proceedings paper
    1995, 1995 IEEE MTT-S International Microwave Symposium Digest; 16-20 May 1995; Orlando, FL, USA., p.1029-1032
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    Accurate on-wafer measurement of the large-signal behavior of a nonlinear microwave device

    Verspecht, J.
    ;
    Debie, Peter
    ;
    Martens, Luc  
    ;
    Barel, A.
    Journal article
    1996, HF Revue - HF Tijdschrift, 2, p.35-45
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    Correction technique for on-chip modulation response measurements of optoelectronic devices

    Debie, Peter
    ;
    Martens, Luc  
    Journal article
    1995, IEEE Trans. Microwave Theory and Techniques, (43) 6, p.1264-1269
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    Design and Characterization of an Integrated Optical Switch Driver Circuit

    Debie, Peter
    ;
    Coppoolse, René
    ;
    De Kesel, Kurt
    ;
    Van Daele, P.
    ;
    Vandewege, Jan
    ;
    Martens, Luc  
    Proceedings paper
    1994, IEEE International Symposium on Circuits and Systems, 30/05/1994, p.149-152
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    Experimental High-Frequency Characterisation and Modelling of GaAs MESFETs and Optoelectronic Components

    Debie, Peter
    PHD thesis
    1995-12
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    Fast and accurate extraction of parasitic resistances for nonlinear GaAs MESFET device models

    Debie, Peter
    ;
    Martens, Luc  
    Journal article
    1995, IEEE Trans. Electron Devices, (42) 12, p.2239-2242
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    Fast and Accurate On-Wafer Extraction of Parasitic Resistances in GaAs MESFET's

    Debie, Peter
    ;
    Martens, Luc  
    ;
    De Zutter, Daniel  
    Proceedings paper
    1994, Proceedings IEEE 1994 International Conference on Microelectronic Test Structures, p.7-11
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    Improved error correction technique for on-wafer lightwave measurements of photodetectors

    Debie, Peter
    ;
    Martens, Luc  
    ;
    Kaiser, D.
    Journal article
    1995, IEEE Photonics Technology Letters, (7) 4, p.418-420
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    Improved on-chip lightwave measurements of non-planar optoelectronic devices

    Debie, Peter
    ;
    Vermaerke, Frank
    ;
    Vermeire, Gerrit
    ;
    Van Daele, P.
    ;
    Demeester, Piet  
    ;
    Martens, Luc  
    Proceedings paper
    1995, Integrating Intelligent Instrumentation and Control.1995 IEEE Instrumentation/Measurement Technology Conference. IMTC Proceeding, p.812-815
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    Measuring on-wafer high-frequency modulation response characteristics of optical transmitters and detectors

    Debie, Peter
    ;
    Martens, Luc  
    Journal article
    1996, IEEE Trans. Instrumentation and Measurement, (45) 2, p.504-510

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