Browsing by Author "Debie, Peter"
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Publication Accurate Error Correction Technique for On-Chip Lightwave Measurements of Optoelectronic Devices
;Debie, PeterProceedings paper1994, 1994 IEEE MTT-S Microwave Symposium, 23/05/1994, p.1589-1592Publication Accurate on-wafer measurement of phase and amplitude of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave device
Proceedings paper1995, 1995 IEEE MTT-S International Microwave Symposium Digest; 16-20 May 1995; Orlando, FL, USA., p.1029-1032Publication Accurate on-wafer measurement of the large-signal behavior of a nonlinear microwave device
Journal article1996, HF Revue - HF Tijdschrift, 2, p.35-45Publication Correction technique for on-chip modulation response measurements of optoelectronic devices
;Debie, PeterJournal article1995, IEEE Trans. Microwave Theory and Techniques, (43) 6, p.1264-1269Publication Design and Characterization of an Integrated Optical Switch Driver Circuit
Proceedings paper1994, IEEE International Symposium on Circuits and Systems, 30/05/1994, p.149-152Publication Experimental High-Frequency Characterisation and Modelling of GaAs MESFETs and Optoelectronic Components
Debie, PeterPHD thesis1995-12Publication Fast and Accurate On-Wafer Extraction of Parasitic Resistances in GaAs MESFET's
Proceedings paper1994, Proceedings IEEE 1994 International Conference on Microelectronic Test Structures, p.7-11Publication Improved error correction technique for on-wafer lightwave measurements of photodetectors
Journal article1995, IEEE Photonics Technology Letters, (7) 4, p.418-420Publication Improved on-chip lightwave measurements of non-planar optoelectronic devices
Proceedings paper1995, Integrating Intelligent Instrumentation and Control.1995 IEEE Instrumentation/Measurement Technology Conference. IMTC Proceeding, p.812-815Publication Measuring on-wafer high-frequency modulation response characteristics of optical transmitters and detectors
;Debie, PeterJournal article1996, IEEE Trans. Instrumentation and Measurement, (45) 2, p.504-510