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Improved error correction technique for on-wafer lightwave measurements of photodetectors
Publication:
Improved error correction technique for on-wafer lightwave measurements of photodetectors
Date
1995
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Debie, Peter
;
Martens, Luc
;
Kaiser, D.
Journal
IEEE Photonics Technology Letters
Abstract
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1961
since deposited on 2021-09-29
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last week
Acq. date: 2025-12-08
Citations
Metrics
Views
1961
since deposited on 2021-09-29
2
last month
1
last week
Acq. date: 2025-12-08
Citations