Publication:
Improved error correction technique for on-wafer lightwave measurements of photodetectors
Date
| dc.contributor.author | Debie, Peter | |
| dc.contributor.author | Martens, Luc | |
| dc.contributor.author | Kaiser, D. | |
| dc.contributor.imecauthor | Martens, Luc | |
| dc.date.accessioned | 2021-09-29T13:05:24Z | |
| dc.date.available | 2021-09-29T13:05:24Z | |
| dc.date.issued | 1995 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/608 | |
| dc.source.beginpage | 418 | |
| dc.source.endpage | 420 | |
| dc.source.issue | 4 | |
| dc.source.journal | IEEE Photonics Technology Letters | |
| dc.source.volume | 7 | |
| dc.title | Improved error correction technique for on-wafer lightwave measurements of photodetectors | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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