Browsing by Author "Demeulemeester, Cindy"
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Publication Backside analysis of ultra-thin film stacks in microelectronics technology using X-ray photoelectron spectroscopy
Proceedings paper2009, Electron Crystallography for Materials Research and Quantitative Characterization of Nanostructured Materials, 13/04/2009, p.HH08-04Publication Conductive diamond tips with sub-nanometer electrical resolution for characterization of nanoelectronics device structures
Journal article2009, physica status solidi A, (206) 9, p.2077-2081Publication Microfabricated diamond tip for nanoprobing
Journal article2009, Microelectronic Engineering, (86) 4_6, p.1222-1225Publication Optical force measurement system with mirror probe for nanoprobing inside a scanning electron microscope
Meeting abstract2009, 35th International Conference on Micro & Nano Engineering - MNE, 28/09/2009Publication Optical force measurement system with mirror probe for nanoprobing inside a scanning electron microscope
Journal article2010, Microelectronic Engineering, (87) 5_8, p.1410-1412Publication Substrate transfer for GaN-LED on Si (111) 4 inch
Proceedings paper2011, IMAPS 44th International Symposium on Microelectronics, 9/10/2011