Browsing by Author "Denis, Samuel"

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Progress towards a physical contact model for scanning spreading resistance microscopy

Eyben, Pierre
;
Denis, Samuel
;
Clarysse, Trudo
;
Vandervorst, Wilfried
Oral presentation
2002, E-MRS Spring Meeting Symposium E: Advanced Characterisation of Semiconductor Materials and Devices
Progress towards a physical contact model for scanning spreading resistance microscopy

Eyben, Pierre
;
Denis, Samuel
;
Clarysse, Trudo
;
Vandervorst, Wilfried
Journal article
2003, Materials Science & Engineering B, (102) 1_3, p.132-137