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Progress towards a physical contact model for scanning spreading resistance microscopy
Publication:
Progress towards a physical contact model for scanning spreading resistance microscopy
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Date
2003
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Eyben, Pierre
;
Denis, Samuel
;
Clarysse, Trudo
;
Vandervorst, Wilfried
Journal
Materials Science & Engineering B
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1869
since deposited on 2021-10-15
Acq. date: 2025-12-16
Citations
Metrics
Views
1869
since deposited on 2021-10-15
Acq. date: 2025-12-16
Citations