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Browsing by Author "Destefanis, V."

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    Strain measurements in electronic devices by aberration-corrected HRTEM and dark-field holography

    Hue, Florent
    ;
    Houdellier, F.
    ;
    Snoeck, E.
    ;
    Hartmann, J.P.
    ;
    Destefanis, V.
    ;
    Bender, Hugo  
    Proceedings paper
    2008-09, 14th European Microscopy Congress, 1/09/2008, p.123-124

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