Publication:

Strain measurements in electronic devices by aberration-corrected HRTEM and dark-field holography

Date

Loading...
Thumbnail Image

Author(s)

Journal

Abstract

Description

Metrics

Views

1840 since deposited on 2021-10-17
Acq. date: 2025-10-23

Citations

Metrics

Views

1840 since deposited on 2021-10-17
Acq. date: 2025-10-23

Citations