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Strain measurements in electronic devices by aberration-corrected HRTEM and dark-field holography
Publication:
Strain measurements in electronic devices by aberration-corrected HRTEM and dark-field holography
Date
2008-09
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hue, Florent
;
Houdellier, F.
;
Snoeck, E.
;
Hartmann, J.P.
;
Destefanis, V.
;
Bender, Hugo
;
Claverie, Alain
;
Hytch, Martin
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1840
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1840
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations