Browsing by Author "Diouf, C."

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A new method for quickly evaluating reversible and permanent components of the BTI degradation

Garros, X.
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Subirats, Alexandre
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Reimbold, G.
;
Gaillard, F.
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Diouf, C.
;
Federspiel, X.
;
Huard, V.
Proceedings paper
2018, 2018 IEEE International Reliability Physics Symposium - IRPS, 11/03/2018, p.P-RT.6
An extended "Y function" method for saturation regime characterization: application to bulk Si and Ge technologies

Diouf, C.
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Cros, A.
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Monfray, S.
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Mitard, Jerome
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Rosa, J.
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Gloria, D.
;
Ghibaudo, G.
Proceedings paper
2012, International Conference on Solid State Devices and Materials - SSDM, 25/09/2012
Y function method applied to saturation regime: apaprent saturation mobility and saturation velocity extraction

Diouf, C.
;
Cros, A.
;
Monfray, S.
;
Mitard, Jerome
;
Rosa, S.
;
Gloria, D.
;
Ghibaudo, G.
Journal article
2013, Solid-State Electronics, 85, p.12-14