Browsing by Author "Dixon-Luinenburg, Oberon"
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Publication Carrier profiling with Fast Fourier transform scanning spreading resistance microscopy: A case study for Ge, GaAs, InGaAs, and InP
Journal article2019, Ultramicroscopy, 206, p.112809Publication Individual device analysis using hybrid TEM-scalpel SSRM metrology
Proceedings paper2017, Frontiers of Characterization and Metrology for Nanoelectronics, 21/03/2017