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Browsing by Author "Donaton, R."

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    Advanced solutions for copper and low k technology

    Beyer, Gerald  
    ;
    Baklanov, Mikhaïl
    ;
    Brongersma, Sywert  
    ;
    De Roest, David  
    ;
    Donaton, R.
    Oral presentation
    2000, Semicon Europe; 2000; München, Germany.
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    The influence of Ti capping layers on CoSi2 formation

    Detavernier, C.
    ;
    Donaton, R.
    ;
    Maex, Karen  
    ;
    Van Meirhaeghe, R.
    ;
    Cardon, F.
    Oral presentation
    1999, European Workshop Materials for Advanced Metallization; March 8-10, 1999; Oostende, Belgium.

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