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Browsing by Author "Doria, R.T."

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    An analytical model for the non-linearity of triple gate SOI MOSFETs

    Doria, R.T.
    ;
    Martino, J.A.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Pavanello, M.A.
    Proceedings paper
    2011, Advanced Semiconductor-on-Insulator Technology and Related Physics 15, 1/05/2011, p.189-194
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    Channel length influence on the low-frequency noise of strained 45o rotated triple gate SOI nFinFETs

    de Souza, M.A.S.
    ;
    Doria, R.T.
    ;
    Martino, Joao
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Pavanello, Marcelo
    Proceedings paper
    2014, 10th Workshop on the Thematic Network on Silicon on Insulator Technology, Devices and Circuits - EUROSOI, 29/01/2014, p.1-2
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    Fin width influence on the harmonic distortion of standard and strained FinFETs operating in saturation

    Doria, R.T.
    ;
    Cerdeira, A.
    ;
    Martino, J.A.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Pavanello, M.A.
    Proceedings paper
    2009, 24th Symposium on Microelectronics Technology and Devices - SBMicro, 31/08/2009, p.613-620
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    Harmonic distortion of strained triple-gate FinFETs at low temperatures

    Doria, R.T.
    ;
    Martino, J.A.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Pavanello, M.A.
    Proceedings paper
    2010, 9th International Workshop on Low Temperature Electronics - WOLTE, 21/06/2010, p.57-59
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    Harmonic distortion of unstrained and strained FinFETs operating in saturation

    Doria, R.T.
    ;
    Cerdeira, A.
    ;
    Martino, J.A.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Pavanello, M.A.
    Journal article
    2010, IEEE Transactions on Electron Devices, (57) 12, p.3303-3311
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    Influence of substrate rotation on the low frequency noise of strained triple-gate MuGFETs

    de Souza, Marcio
    ;
    Doria, R.T.
    ;
    Simoen, Eddy  
    ;
    Martino, Joao
    ;
    Claeys, Cor
    ;
    Pavanello, Marcello
    Proceedings paper
    2013, IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference, 7/10/2013, p.2a.3
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    Uniaxial mechanical stress influence on the low frequency noise in FD SOI nMOSFETs operating in saturation

    de Souza, M.A.S.
    ;
    Doria, R.T.
    ;
    Pavanello, M.A.
    ;
    Claeys, Cor
    ;
    Simoen, Eddy  
    Proceedings paper
    2012, 8th International Caribbean Conference on Devices, Circuts and Systems - ICCDCS, 14/03/2012

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