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Channel length influence on the low-frequency noise of strained 45o rotated triple gate SOI nFinFETs
Publication:
Channel length influence on the low-frequency noise of strained 45o rotated triple gate SOI nFinFETs
Date
2014
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
de Souza, M.A.S.
;
Doria, R.T.
;
Martino, Joao
;
Simoen, Eddy
;
Claeys, Cor
;
Pavanello, Marcelo
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1849
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Acq. date: 2025-10-28
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Metrics
Views
1849
since deposited on 2021-10-22
1
last week
Acq. date: 2025-10-28
Citations