Publication:
Channel length influence on the low-frequency noise of strained 45o rotated triple gate SOI nFinFETs
Date
| dc.contributor.author | de Souza, M.A.S. | |
| dc.contributor.author | Doria, R.T. | |
| dc.contributor.author | Martino, Joao | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.author | Pavanello, Marcelo | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-22T01:09:45Z | |
| dc.date.available | 2021-10-22T01:09:45Z | |
| dc.date.issued | 2014 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23726 | |
| dc.source.beginpage | 1 | |
| dc.source.conference | 10th Workshop on the Thematic Network on Silicon on Insulator Technology, Devices and Circuits - EUROSOI | |
| dc.source.conferencedate | 29/01/2014 | |
| dc.source.conferencelocation | Taragona Spain | |
| dc.source.endpage | 2 | |
| dc.title | Channel length influence on the low-frequency noise of strained 45o rotated triple gate SOI nFinFETs | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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