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Browsing by Author "Drobnŭ, Jakub"

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    DLTS Study of Electrically Active Defects in semi-vertical GaN-on-Si FETs

    Drobnŭ, Jakub
    ;
    Marek, Juraj
    ;
    Koza, A.
    ;
    Vadovski, J.
    ;
    Geens, Karen  
    ;
    Borga, Matteo  
    ;
    Liang, Hu  
    Proceedings paper
    2020, Solid State Surfaces and Interfaces 2020 (SSSI), 23/11/2020, p.25-26
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    Electrical and DLTS Characterization of Gate Interfaces in GaN-based Trench-gate semi-vertical MOS devices

    Marek, Juraj
    ;
    Mikolášek, Miroslav
    ;
    Drobnŭ, Jakub
    ;
    Kozarik, Jozef
    ;
    Chvála, Aleš
    ;
    Geens, Karen  
    Proceedings paper
    2020, Solid State Surfaces and Interfaces 2020 (SSSI), 23/11/2020, p.57-58
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    Study of emission and capture processes in semi-vertical GaN-on-Si trench-MOSFETs

    Drobnŭ, Jakub
    ;
    Marek, Juraj
    ;
    Kosa, A.
    ;
    Geens, Karen  
    ;
    Borga, Matteo  
    ;
    Liang, Hu  
    ;
    You, Shuzhen  
    Proceedings paper
    2021, The 13th International Conference on Advanced Semiconductor Devices And Microsystems (ASDAM 2020), 11/10/2020, p.123-126

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