Publication:
Electrical and DLTS Characterization of Gate Interfaces in GaN-based Trench-gate semi-vertical MOS devices
Date
Loading...
Journal
Abstract
Description
Statistics
Views
1971 since deposited on 2021-10-29
Acq. date: 2026-02-24
Citations
Statistics
Views
1971 since deposited on 2021-10-29
Acq. date: 2026-02-24
Citations