Publication:
Electrical and DLTS Characterization of Gate Interfaces in GaN-based Trench-gate semi-vertical MOS devices
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1976 since deposited on 2021-10-29
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Acq. date: 2026-10-05
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Statistics
Views
1976 since deposited on 2021-10-29
3last month
1last week
Acq. date: 2026-10-05
Citations