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Browsing by Author "Duan, G.X."

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    Total ionizing dose effects on Ge channel pFETs with raised Si0.55Ge0.45 source drain

    Wang, L.
    ;
    Zhang, E.X.
    ;
    Zhang, C.X.
    ;
    Duan, G.X.
    ;
    Schrimpf, R.D.
    ;
    Fleetwood, D.M.
    ;
    Reed, R.A.
    Proceedings paper
    2015, IEEE Nuclear & Space Radiation Effects Conference - NSREC, 13/07/2015, p.22-25

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