Publication:

Total ionizing dose effects on Ge channel pFETs with raised Si0.55Ge0.45 source drain

Date

2015

Proceedings Paper

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Author(s)

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Fleetwood, D.M.

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Witters, Liesbeth

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Collaert, Nadine

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Linten, Dimitri

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Pantelides, S.T.

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Acq. date: 2026-05-19