Browsing by Author "Dultsev, F. N."

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Calculation of pore size distribution in the ellipsometric porosimetry: method and reliability

Mogilnikov, K. P.
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Polovinkin, V. G.
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Dultsev, F. N.
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Baklanov, Mikhaïl
Proceedings paper
2000, Low-Dielectric Constant Materials V; 5-9 April 1999; San Francisco, Ca, USA., p.81-86
Determination of pore size distribution in thin films by ellipsometric posimetry

Baklanov, Mikhaïl
;
Mogilnikov, K. P.
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Polovinkin, V. G.
;
Dultsev, F. N.
Journal article
2000, J. Vacuum Science and Technology B, (18) 3, p.1385-1391
Development of a non-destructive thin film porosimetry: pore size distribution and pore volume of porous silica

Baklanov, Mikhaïl
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Dultsev, F. N.
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Kondoh, Eiichi
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Mogilnikov, K. P.
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Maex, Karen
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Wang, Sharon
Proceedings paper
1999, Advanced Metallization Conference in 1998. Proceedings of the Conference;, p.507-512
Nondestructive determination of pore size distribution in thin films deposited on solid substrates

Dultsev, F. N.
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Baklanov, Mikhaïl
Journal article
1999, Electrochemical and Solid State Letters, (2) 4, p.192-194