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Browsing by Author "Egger, P."

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    Analysis of HBM ESD testers and specifications using a fourth order lumped element model

    Verhaege, Koen
    ;
    Roussel, Philippe  
    ;
    Groeseneken, Guido  
    ;
    Maes, Herman
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    Gieser, H.
    ;
    Russ, Christian
    Journal article
    1994, Quality and Reliability Engineering International, 10, p.325-334
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    Influence of tester, test method and device type on CDM ESD testing

    Verhaege, Koen
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    Groeseneken, Guido  
    ;
    Maes, Herman
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    Egger, P.
    ;
    Gieser, H.
    Proceedings paper
    1994, Proceedings 16th Annual EOS/ESD Symposium, 26/09/1994, p.49-62
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    Influence of tester, test method and device type on CDM ESD testing

    Verhaege, K.
    ;
    Groeseneken, Guido  
    ;
    Maes, Herman
    ;
    Egger, P.
    ;
    Gieser, H.
    Journal article
    1995, IEEE Trans. Components Packaging and Manufacturing Technology. Part A, (18) 2, p.284-94

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