Browsing by Author "El Sayed, Karim"
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Publication Analysis of copper plasticity impact in TSV-middle and backside TSV-last fabrication processes
Proceedings paper2015, IEEE 65th Electronic Components & Technology Conference - ECTC, 2/05/2015, p.1038-1044Publication Performance and reliability impact of copper plasticity in backside TSV-last fabrication process
Journal article2016, IEEE Transactions on Device and Materials Reliability, (16) 3, p.402-412