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Browsing by Author "El-Sayed, A.M."

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    Simulation study: the effect of random dopants and random traps on hot-carrier degration in nFinFETs

    Makarov, A.
    ;
    Kaczer, Ben  
    ;
    Roussel, Philippe  
    ;
    Vaisman Chasin, Adrian  
    ;
    Vandemaele, Michiel  
    Proceedings paper
    2020, International Conference on Solid-State Devices and Materials - SSDM, 2/09/2019, p.609-610

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